搜索包含 Reliability Analysis Center (U.S.) 的图书 - 暨南大学图书馆

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	Circuit analysis, simulation, and design 0 索取号：TN47/E9028 作者：出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986-1987.		Analysis and design of digital integrated circuits 0 索取号：TN431.2/E901 作者：Hodges、 David A.、 1937-、Jackson、 Horace G.、出版社：New York : McGraw-Hill, 1983.
	Semiconductor and integrated circuit fabrication techniques 0 索取号：TN43/E801 作者：Gise、 Peter E.、Blanchard、 Richard、 joint author.、Fairchild Management and Career Development Center.、Fairchild Camera and Instrument Co.、出版社：Reston, Va. : Reston Pub. Co., 1979.		Introduction to circuit analysis 0 索取号：TN4/E8010 作者：Trick、 Timothy N.、 1939-、出版社：New York : Wiley, 1977.
	Analysis and design of integrated electronic circuits 0 索取号：TN4/E9010 作者：Chirlian、 Paul M.、出版社：New York : Harper & Row, 1981.		Public management reform : a comparative analysis 0 索取号：D523/E20011 作者：Pollitt、 Christopher.、Bouckaert、 Geert.、出版社：Oxford [UK] ; New York : Oxford University Press, 2000.
	Multiresolution image processing and analysis 0 索取号：TN27/E903 作者：出版社：Berlin ; New York : Springer-Verlag, 1984.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Digital logic circuit analysis and design 0 索取号：TN79/E991 作者：出版社：Beijing Tsinghua University Press 1998
	Analysis of biological development 0 索取号：Q11/E991 作者：Kalthoff、 Klaus.、出版社：New York : McGraw-Hill, c1996.		Techniques of financial analysis : a modern approach 0 索取号：F810/E998.9 作者：Helfert、 Erich A.、出版社：Chicago : Irwin Professional Pub., c1997.
	Practical algorithms for image analysis : description, examples, and code 0 索取号：TP391.41/E992 作者：Seul、 Michael.、O'Gorman、 Lawrence.、Sammon、 Michael J.、出版社：New York : Cambridge University Press, 1999.		Reliability of analogue electronic systems 0 索取号：TN06/E902 作者：Klaassen、 Klaas B.、 1941-、出版社：Amsterdam ; New York : Elsevier ; New York, N.Y. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1984.
	Applied reliability 0 索取号：TN06/E901 作者：Tobias、 Paul A.、Trindade、 David C.、出版社：New York : Van Nostrand Reinhold, 1986.		Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.

	Circuit analysis, simulation, and design 0 索取号：TN47/E9028 作者：出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986-1987.		Analysis and design of digital integrated circuits 0 索取号：TN431.2/E901 作者：Hodges、 David A.、 1937-、Jackson、 Horace G.、出版社：New York : McGraw-Hill, 1983.
	Semiconductor and integrated circuit fabrication techniques 0 索取号：TN43/E801 作者：Gise、 Peter E.、Blanchard、 Richard、 joint author.、Fairchild Management and Career Development Center.、Fairchild Camera and Instrument Co.、出版社：Reston, Va. : Reston Pub. Co., 1979.		Introduction to circuit analysis 0 索取号：TN4/E8010 作者：Trick、 Timothy N.、 1939-、出版社：New York : Wiley, 1977.
	Analysis and design of integrated electronic circuits 0 索取号：TN4/E9010 作者：Chirlian、 Paul M.、出版社：New York : Harper & Row, 1981.		Public management reform : a comparative analysis 0 索取号：D523/E20011 作者：Pollitt、 Christopher.、Bouckaert、 Geert.、出版社：Oxford [UK] ; New York : Oxford University Press, 2000.
	Multiresolution image processing and analysis 0 索取号：TN27/E903 作者：出版社：Berlin ; New York : Springer-Verlag, 1984.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Digital logic circuit analysis and design 0 索取号：TN79/E991 作者：出版社：Beijing Tsinghua University Press 1998
	Analysis of biological development 0 索取号：Q11/E991 作者：Kalthoff、 Klaus.、出版社：New York : McGraw-Hill, c1996.		Techniques of financial analysis : a modern approach 0 索取号：F810/E998.9 作者：Helfert、 Erich A.、出版社：Chicago : Irwin Professional Pub., c1997.
	Practical algorithms for image analysis : description, examples, and code 0 索取号：TP391.41/E992 作者：Seul、 Michael.、O'Gorman、 Lawrence.、Sammon、 Michael J.、出版社：New York : Cambridge University Press, 1999.		Reliability of analogue electronic systems 0 索取号：TN06/E902 作者：Klaassen、 Klaas B.、 1941-、出版社：Amsterdam ; New York : Elsevier ; New York, N.Y. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1984.
	Applied reliability 0 索取号：TN06/E901 作者：Tobias、 Paul A.、Trindade、 David C.、出版社：New York : Van Nostrand Reinhold, 1986.		Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.